What charts are available
NWA Quality Analyst offers all standard SQC charts plus
many special purpose charts:
Attribute Control Charts
- Percent Defective (p)
- Number Defective (np)
- Defects (c)
- Defects per Unit (u)
Chart Customization
- Calculate control limits automatically or enter them manually
- Automatically
adjust control limits for changing subgroup size
- Create subgroups
with up to 99 measurements
- Select from among five ways to handle
missing data
- Derive control limits by any
of three methods, including exact probability limits
- Choose up to three user-defined, independently calculated sets
of control limits
- Select from four methods of calculating sigma
- Define up to 23 custom pattern rules;
Western Electric rules are the default
- Shift
control limits to show up to 99 process shifts per chart
- Background colors
can be defined for up to three chart zones to create "Rainbow
Charts."
Other Charts
-
Scatter
-
Run
-
Normal Probability
-
Quantile
-
Box Plot
Process Capability Analysis
- Eight distribution types:
- Normal
- Skewness and Kurtosis Adjusted (Johnson)
- Two Parameter Log Normal
- Three Parameter Log Normal
- Truncated Normal
- Folded Normal
- Weibull
- Rayleigh
- Capability indices can be adjusted for nonnormal distributions
- Bilateral and Unilateral
specifications supported
- Select the indices and statistics
to report
- Confidence bounds provided for capability
indices
- Set histogram bars and scale
automatically or manually
- Multiple variable process
capability reports
- Box plots
Pareto Analysis
- Show up to 500 defect categories
- Diagram can be ranked by cost or
number of defects
- Cumulative effects can be graphically
displayed
Capability Indices
- CAM cp
- CPL
- Pp
- CAM cpk
- Cpm
- Ppk
- Cm
- CPU
- Tz
- Cmk
- CR%
- Zlsl
- Cp
- "In the Box"
- Zmin
- Cpk
- K
- Zusl
Includes Automotive Industry Action Group (AIAG) indices
Exception Reporting
Design any number of exception reports for each Data Set and provide
a wide range of reports on SPC, specification, and pattern-rule violations.
Short Run Analysis
Available for all SPC charts and process capability.
Additional Data Analysis
Descriptive Statistics
- Mean
- Standard Deviation
- Coefficient of Variation
- Standard Error
- Skewness
- Kurtosis
- Moments about the Mean
Means (t) Tests
- Single Sample t-test
- Unpaired Sample t-test
- Paired Sample t-test
- Pearson Product Moment Correlation
Chi-square Analysis
- Bartlett's Chi-Square
- Difference Among Proportions
- Equal Expected Frequencies
- Unequal Expected Frequencies
Weibull (Reliability Analysis)
- Full or Censored Data
- Maximum Likelihood and Rank Regression
- Methods
- Includes Exponential Distribution
Non-parametrics
- Kruskal-Wallis
- Wald-Wolfowitz Runs Test
Correlation
Analyze up to 50 variables simultaneously.
Single Variable Regression/Curve Fitting
- Linear
- Power
- Exponential
- Logarithmic
- Stability Analysis
Multiple Linear Regression
Polynomial Regression
ANOVA (one-way)
Random Number Generator
- Integer or Real Data Values
- With orWithout Replacement
- Uniform or Normally Distributed Data
Data Entry and Management
Complete data file creation and maintenance capability, including:
- Variable
Definition
- Variable Type
- Format Control
- Target and Specification Values
- Data-Entry Masks
Data File Structure
Data tables can be up to 500 characteristics by 999,999 rows.
Database Connectivity
- Direct connectivity to Access and
Excel
- ODBC connection to all major databases
- Supports user-defined SQL
- Interface toWonderware IndustrialSQL Server*
Output
Integrated text and graphics display, user-defined layouts, JPG, PNG,
BMP, and XML.
Assignable Cause/Corrective Action
Predefined Cause and Action text and comments up to 65 characters assigned
to any SPC point. Text and Pareto reporting. |